Wafer Probe Station is used in connection with test system in Wafer Test process.
It is a device to move wafer automatically to examine fair quality of individual chip on the wafer.
Probe Station is seperated depending on purpose.
For analysis, for mass production as well as manual, semi-automatic, full-automatic.
Currently, we are accumulating knowledge through the experience of refurbishing used probers such as TSK, Tokyo Electron, Electroglas.
Meanwhile, we are focusing on our brand development, on the basis of own technology secured around the Research Institute.