> Product > Analysis Prober
Probe Card
Probe Station
LED Light
Standard Resistance

Analysis Prober

Signatone H-100 Probe Station
H-100 Probe Station Click to Enlarge H-100 Series Probe Stations include a three inch square device / substrate chuck and are primarily designed for probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits. The H-150 system, however, can be equipped with a four inch diameter wafer chuck for probing wafers up to four inches in diameter. H-100 Series Probe Stations are available in three versions: H-100, H-120 and H-150.

The modular design provides a wide number of options to suit a broad range of needs. All models include an aluminum base casting, a device stage with four inches of X-Y travel, a linear motion platen that can be raised and lowered using either a crank or a lever, and a microscope tower for mounting Stereozoom optics in a fixed position. A 4" x 4" microscope stage is optional. The platen will accept up to six magnetic based micropositioners and a probe card adapter for use with probe cards. Micropositioner electrical connections are made through six pin jacks that correspond to color coded banana plugs.